The TAP3500 is an Active Probe from Tektronix. Use an electrical probe to test equipment and measure currents and voltages. Probes are an integral part of any electrical power testing toolbox to ensure accurate measurements, reliability, and safety. Probes can use pulse waveforms to test components without removing them from circuits with in-circuit capabilities. Choose the probe that complements your system.
Additional Features:
Bandwidth (probe only): ≥3.5 GHz
Attenuation (probe only): 10:1.
Rise Time (probe only): <130 ps
Input Capacitance: ≤0.8 pF.
Input Resistance: 40 kω.
Input Dynamic Range: –4 V to +4 V.
Input Offset Range: –10 V to +10 V.
Max Input Voltage (non-destruct): ±30 V (DC + pkAC).
Propagation Delay: 5.3 ns
Outstanding Electrical Performance
High Probe Bandwidth
Fast Probe Rise Time
Excellent Signal Fidelity
≤0.8 pF Input Capacitance
40 kω Input Resistance
–4 V to +4 V Input Dynamic Range
–10 V to +10 V DC Input Offset Range
±30 V (DC + pkAC) Max Input Voltage (Non-Destruct)
Versatile Mechanical Performance
Small Compact Probe Head for Probing Small Geometry Circuit Elements
DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
Robust Design for Reliability
Easy to Use
Connects Directly to DPO7000 and DPO4000 Series Oscilloscopes Using the New TekVPI™ Probe Interface
Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset
Power Requirements
TAP3500 is powered directly by the DPO7000 and DPO4000 Series Oscilloscopes using TekVPI probe interface.
Recommended Oscilloscopes
DPO7000 and DPO4000 Series Oscilloscopes with TekVPI probe interface.
Applications
Verification, Debug and Characterization of High-speed Designs
Signal Integrity, Jitter and Timing Analysis
Manufacturing Engineering and Test
Signals with Voltage Swings Up to 8 Vpk-pk
Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high frequency measurements. With our ultra-low input capacitance and unique interface, the TAP3500 Single-ended Active FET probe provides excellent high-speed electrical and mechanical performance required for today’s digital system designs.
Specifically designed for use and direct connection to the TekVPI probe interface used on the DPO7000 and DPO4000 Series oscilloscopes, the TAP3500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kω input resistance
Versatile DUT connectivity for attaching to small SMDs
Preserves oscilloscope bandwidth at the probe tip for DPO7000 and DPO4000 Series Oscilloscope models up to 3.5 GHz
The TAP3500 is an Active Probe from Tektronix. Use an electrical probe to test equipment and measure currents and voltages. Probes are an integral part of any electrical power testing toolbox to ensure accurate measurements, reliability, and safety. Probes can use pulse waveforms to test components without removing them from circuits with in-circuit capabilities. Choose the probe that complements your system.
Additional Features:
- Bandwidth (probe only): ≥3.5 GHz
- Attenuation (probe only): 10:1.
- Rise Time (probe only): <130 ps
- Input Capacitance: ≤0.8 pF.
- Input Resistance: 40 kΩ.
- Input Dynamic Range: –4 V to +4 V.
- Input Offset Range: –10 V to +10 V.
- Max Input Voltage (non-destruct): ±30 V (DC + pkAC).
- Propagation Delay: 5.3 ns
Outstanding Electrical Performance
- High Probe Bandwidth
- Fast Probe Rise Time
- Excellent Signal Fidelity
- ≤0.8 pF Input Capacitance
- 40 kΩ Input Resistance
- –4 V to +4 V Input Dynamic Range
- –10 V to +10 V DC Input Offset Range
- ±30 V (DC + pkAC) Max Input Voltage (Non-Destruct)
Versatile Mechanical Performance
- Small Compact Probe Head for Probing Small Geometry Circuit Elements
- DUT Attachment Accessories Enable Connection to SMDs as Small as 0.5 mm Pitch
- Robust Design for Reliability
Easy to Use
- Connects Directly to DPO7000 and DPO4000 Series Oscilloscopes Using the New TekVPI™ Probe Interface
- Provides Automatic Units Scaling and Readout on the Oscilloscopes Display
- Easy Access to Oscilloscope Probe Menu Display for Probe Status/Diagnostic Information and to Control Probe DC Offset
Power Requirements
- TAP3500 is powered directly by the DPO7000 and DPO4000 Series Oscilloscopes using TekVPI probe interface.
Recommended Oscilloscopes
- DPO7000 and DPO4000 Series Oscilloscopes with TekVPI probe interface.
Applications
- Verification, Debug and Characterization of High-speed Designs
- Signal Integrity, Jitter and Timing Analysis
- Manufacturing Engineering and Test
- Signals with Voltage Swings Up to 8 Vpk-pk
Selecting the right probe for your application is key to attaining the best signal fidelity in your measurements. Active probes provide truer signal reproduction and fidelity for high frequency measurements. With our ultra-low input capacitance and unique interface, the TAP3500 Single-ended Active FET probe provides excellent high-speed electrical and mechanical performance required for today’s digital system designs.
Specifically designed for use and direct connection to the TekVPI probe interface used on the DPO7000 and DPO4000 Series oscilloscopes, the TAP3500 Active FET probe achieves high-speed signal acquisition and measurement fidelity by solving three traditional problems:
- Lower DUT loading effects with ≤0.8 pF input capacitance and 40 kΩ input resistance
- Versatile DUT connectivity for attaching to small SMDs
- Preserves oscilloscope bandwidth at the probe tip for DPO7000 and DPO4000 Series Oscilloscope models up to 3.5 GHz
