The 590 is a used analyzer from Keithley. Analyzers are key tools to test electronic equipment in the engineering, medical, automotive, and technological industries. Use analyzers for monitoring the performances of many different types of electronic devices. You may need analyzers for the measurement of components such as audio spectrums, voltages and currents, signals, and frequencies.
Additional Features:
0.1fF sensitivity to test small devices.
Ranges up to 20nF (at 100 kHz, using 5904 adapter) to test large, leaky, or forward biased devices.
Test signal voltage of 15mV RMS.
Choice of 1 MHz frequency for compliance with existing test standards or 100 kHz for improved resolution, range, and accuracy.
Selectable measurement rate (1 to 1000 readings per second) and filter to optimize speed/resolution trade-offs.
Sophisticated correction for transmission line errors due to device connections.
Built-in test setup and correction value storage, analysis, and plotter control to minimize computer programming
The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.
High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semico
nductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.
The 590 is a used analyzer from Keithley. Analyzers are key tools to test electronic equipment in the engineering, medical, automotive, and technological industries. Use analyzers for monitoring the performances of many different types of electronic devices. You may need analyzers for the measurement of components such as audio spectrums, voltages and currents, signals, and frequencies.
Additional Features:
- 0.1fF sensitivity to test small devices.
- Ranges up to 20nF (at 100 kHz, using 5904 adapter) to test large, leaky, or forward biased devices.
- Test signal voltage of 15mV RMS.
- Choice of 1 MHz frequency for compliance with existing test standards or 100 kHz for improved resolution, range, and accuracy.
- Selectable measurement rate (1 to 1000 readings per second) and filter to optimize speed/resolution trade-offs.
- Sophisticated correction for transmission line errors due to device connections.
- Built-in test setup and correction value storage, analysis, and plotter control to minimize computer programming
The Keithley 590 C-V Analyzer measures capacitance versus voltage (C-V) and capacitance versus time (C-t) characteristics of semiconductor devices. Unlike other capacitance measurement instruments, the 590 has been tailored to the requirements of semiconductor device testing.
High frequency (100 kHz or 1 MHz) C-V measurements are commonly applied to test p-n or schottky junction and tal-Insulator-Semiconductor (MIS) devices for device characterization and process control. C-V results are highly correlated with performance parameters of functional devices such as FETs, memory cells, CCDs, and isolation structures.
