CSA Group Optics and photonics - Preparation of drawings for optical elements and systems - Surface imperfection specification and measurement systems ISO/TR 21477:2017

Description
ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.
Description
ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.

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Optics and photonics - Preparation of drawings for optical elements and systems - Surface imperfection specification and measurement systems - ISO/TR 21477:2017 - CSA Group
Toronto, Ontario, Canada
Optics and photonics - Preparation of drawings for optical elements and systems - Surface imperfection specification and measurement systems
ISO/TR 21477:2017
Optics and photonics - Preparation of drawings for optical elements and systems - Surface imperfection specification and measurement systems ISO/TR 21477:2017
ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.

ISO/TR 21477:2017 intends to guide the user to understand the origins, meanings and differences between the two systems of specifying and evaluating surface imperfections in ISO 10110-7 and ISO 14997, specifically the dimensional method and the visibility method, and to provide information on how to use them. Tables are provided to show specifications of roughly equivalent yield loss for imperfections in the two systems.

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Technical Specifications

  CSA Group
Product Category Standards and Technical Documents
Product Number ISO/TR 21477:2017
Product Name Optics and photonics - Preparation of drawings for optical elements and systems - Surface imperfection specification and measurement systems
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