ABB Measurement & Analytics Large area diffuse reflectance MBOEM-EMIS

Description
A configured analyzer based on the double-pivot interferometer has been packaged for a very specific purpose: process diffuse reflectance without the use of a fibre optic interface. This analyzer is a non-contact system, and is designed to be field mounted in close proximity to the sample. The large area measurement addresses the issue of the non-homogeneity of samples, which is quite regularly associated with solid samples. Applications: Material on conveyer belts Fabric / Tow Pellets Fine particles Large and irregular samples The MBOEM-EMIS is a precision FTIR spectrometer instrument that is designed to measure the spectral content of incoming light. Its compact size and rugged packaging allow for installation closer to raw material flow. MBOEM-EMIS features: Three lasers pointers for ease of alignment. A large lid for accessing components A choice of input optics (field swappable)
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Description
A configured analyzer based on the double-pivot interferometer has been packaged for a very specific purpose: process diffuse reflectance without the use of a fibre optic interface. This analyzer is a non-contact system, and is designed to be field mounted in close proximity to the sample. The large area measurement addresses the issue of the non-homogeneity of samples, which is quite regularly associated with solid samples. Applications: Material on conveyer belts Fabric / Tow Pellets Fine particles Large and irregular samples The MBOEM-EMIS is a precision FTIR spectrometer instrument that is designed to measure the spectral content of incoming light. Its compact size and rugged packaging allow for installation closer to raw material flow. MBOEM-EMIS features: Three lasers pointers for ease of alignment. A large lid for accessing components A choice of input optics (field swappable)
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Suppliers

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Product
Description
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Large area diffuse reflectance - MBOEM-EMIS - ABB Measurement & Analytics
Zurich, Switzerland
Large area diffuse reflectance
MBOEM-EMIS
Large area diffuse reflectance MBOEM-EMIS
A configured analyzer based on the double-pivot interferometer has been packaged for a very specific purpose: process diffuse reflectance without the use of a fibre optic interface. This analyzer is a non-contact system, and is designed to be field mounted in close proximity to the sample. The large area measurement addresses the issue of the non-homogeneity of samples, which is quite regularly associated with solid samples. Applications: Material on conveyer belts Fabric / Tow Pellets Fine particles Large and irregular samples The MBOEM-EMIS is a precision FTIR spectrometer instrument that is designed to measure the spectral content of incoming light. Its compact size and rugged packaging allow for installation closer to raw material flow. MBOEM-EMIS features: Three lasers pointers for ease of alignment. A large lid for accessing components A choice of input optics (field swappable)

A configured analyzer based on the double-pivot interferometer has been packaged for a very specific purpose: process diffuse reflectance without the use of a fibre optic interface. This analyzer is a non-contact system, and is designed to be field mounted in close proximity to the sample. The large area measurement addresses the issue of the non-homogeneity of samples, which is quite regularly associated with solid samples.

Applications:

  • Material on conveyer belts
  • Fabric / Tow
  • Pellets
  • Fine particles
  • Large and irregular samples

The MBOEM-EMIS is a precision FTIR spectrometer instrument that is designed to measure the spectral content of incoming light. Its compact size and rugged packaging allow for installation closer to raw material flow.
MBOEM-EMIS features:

  • Three lasers pointers for ease of alignment.
  • A large lid for accessing components
  • A choice of input optics (field swappable)
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Technical Specifications

  ABB Measurement & Analytics
Product Category Infrared Spectrometers
Product Number MBOEM-EMIS
Product Name Large area diffuse reflectance
Optical System Michelson Interferometer
Detector Type Other; (InGaAs)
Sample Type Solids
Spectral Range: 2857 to 1333 nm (28571 to 13333 Å)
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