Texas Instruments SN54BCT8373A Scan Test Devices With Octal D-type Latches 5962-9172501MLA

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Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

Texas Instruments

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Description

Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

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Texas Instruments

Dallas, TX, United States

SN54BCT8373A Scan Test Devices With Octal D-type Latches
5962-9172501MLA

SN54BCT8373A Scan Test Devices With Octal D-type Latches 5962-9172501MLA

Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

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Technical Specifications

	Texas Instruments
Product Category	IC Interfaces
Product Number	5962-9172501MLA
Product Name	SN54BCT8373A Scan Test Devices With Octal D-type Latches
Technology	BCT

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