Texas Instruments SN54BCT8373A Scan Test Devices With Octal D-type Latches 5962-9172501MLA

Description
Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125
  • SN54BCT8373A Scan Test Devices With Octal D-type Latches - 5962-9172501MLA - Texas Instruments
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Description
Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125
Request a Quote Datasheet

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SN54BCT8373A Scan Test Devices With Octal D-type Latches - 5962-9172501MLA - Texas Instruments
Texas Instruments
Dallas, TX, United States
SN54BCT8373A Scan Test Devices With Octal D-type Latches
5962-9172501MLA
SN54BCT8373A Scan Test Devices With Octal D-type Latches 5962-9172501MLA
Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

Scan Test Devices With Octal D-type Latches 24-CDIP -55 to 125

Supplier's Site Datasheet

Technical Specifications

  Texas Instruments
Product Category IC Interfaces
Product Number 5962-9172501MLA
Product Name SN54BCT8373A Scan Test Devices With Octal D-type Latches
Technology BCT
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