The SN54BCT8373A is a scan test device featuring octal D-type latches, designed for enhanced testability in complex circuit board assemblies. It is compatible with the IEEE Standard 1149.1-1990, allowing for boundary scan testing through a 4-wire test access port (TAP) interface. In normal operation, it functions equivalently to the ,ÄôF373 and ,ÄôBCT373 latches, while in test mode, it enables observation and control of the device's I/O boundary. The device supports various test operations, including parallel signature analysis and pseudo-random pattern generation, all synchronized to the TAP interface. It is characterized for military applications, operating within a temperature range of -55¬8C to 125¬8C. The SN54BCT8373A is available in multiple package options, including LCCC and CDIP, making it suitable for diverse design requirements.
Scan Test Devices With Octal D-type Latches 28-LCCC -55 to 125
Boundary Scan Bus Driver, BCT/FBT Series, 8-Func, 8-Bit, True Output, BICMOS, CQCC28
SN54BCT8373A SCAN TEST DEVICES W
| Texas Instruments | Rochester Electronics | Shenzhen Shengyu Electronics Technology Limited | |
|---|---|---|---|
| Product Category | IC Interfaces | IC Interfaces | IC Interfaces |
| Product Number | 5962-9172501M3A | 5962-9172501M3A | 5962-9172501M3A |
| Product Name | SN54BCT8373A Scan Test Devices With Octal D-type Latches | Integrated Circuits (ICs) - Logic - Specialty Logic | |
| Technology | BCT |
