SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
| SemiProbe | |
|---|---|
| Product Category | Wafer and Thin Film Instrumentation |
| Product Number | FA Fully Automatic Inspection System |
| Product Name | IRIS DIE & Wafer Inspection Systems |
| Form Factor | ProbingSystem |
