SemiProbe Specialty Prober Automatic Vacuum Probing System

Description
The ONLY production vacuum probing system designed to grow with your requirements and your business. • Probing modules can be added or exchanged with no interruption to your test operation • Ideal for MEMS, Microbolometers, or any product that is vacuum packaged.
Description
The ONLY production vacuum probing system designed to grow with your requirements and your business. • Probing modules can be added or exchanged with no interruption to your test operation • Ideal for MEMS, Microbolometers, or any product that is vacuum packaged.

Suppliers

Company
Product
Description
Supplier Links
Specialty Prober - Automatic Vacuum Probing System - SemiProbe
Winooski, VT, USA
The ONLY production vacuum probing system designed to grow with your requirements and your business. • Probing modules can be added or exchanged with no interruption to your test operation • Ideal for MEMS, Microbolometers, or any product that is vacuum packaged.

The ONLY production vacuum probing system designed to grow with your requirements and your business.

• Probing modules can be added or exchanged with no
interruption to your test operation
• Ideal for MEMS, Microbolometers, or any product that
is vacuum packaged.

Supplier's Site

Technical Specifications

  SemiProbe
Product Category Imaging Workstations
Product Number Automatic Vacuum Probing System
Product Name Specialty Prober
System Type Turnkey / Complete System
Unlock Full Specs
to access all available technical data

Similar Products

Xi 400 CM - OPTXI40LTCM - Optris Infrared Sensing, LLC
Optris Infrared Sensing, LLC
Specs
Applications Electronics or Semiconductor Inspection
Image Source Thermal or Infrared
View Details
ANALYSETTE 28 ImageSizer -  - Fritsch GmbH - Milling and Sizing
Fritsch GmbH - Milling and Sizing
Specs
Applications Materials Analysis
Stage Type None
View Details
Imaging Workstations - IM-6015 - KEYENCE
Specs
System Type Embedded / Vision Engine; Modular / PC-Based
Applications Alignment / Guidance; Assembly Quality; Biotechnology or Medical; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Pattern Recognition; Production & Quality Control; Tool & Die Monitoring; GD&T
Image Source Area Scan Camera; Optical Microscope
View Details