Hitachi High-Tech America Microspot XRF Ultra Thin Coating Analyzer FT160

Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analyzing solids or liquids over a wide element range from 13Al to 92U on the periodic table. FT160 High Resolution SDD Element range : Al - U Chamber design : closed XY stage options : motorized, wafer Largest sample : 600 x 600 x 20 mm Filters : 5 Polycarpellary optic spot size < 30 µm XRF Controller software