Hitachi High-Tech America Temperature Compensated Surface and Trace Copper Thickness Gauge CMI165

The CMI165 is a temperature-compensated surface and trace copper thickness gauge designed for accurate in-process inspection of copper thickness on PCBs, regardless of the copper's temperature. It is suitable for measuring copper on both hot and cold surfaces, making it ideal for quality assurance in PCB manufacturing and assembly. The gauge can measure copper thickness in various units, including micrometers, mils, and ounces, and is capable of measuring thin etched traces down to 204 micrometers without the need for standards.

This portable and durable gauge features a protective case, an illuminated probe tip for easy positioning, and a user interface available in English or Simplified Chinese. It employs a 4-point electrical probe with a resistance method, ensuring compliance with EN 14571, and offers high repeatability and reliability. The CMI165 is factory calibrated and certified, and it supports both static and continuous mode measurements. It is powered by AA batteries and includes a replaceable probe tip, eliminating the need for recalibration and minimizing factory downtime.