Defense Specifications for legacy and new equipment often include a nuclear hardening requirement to ensure survival and correct operation of non-hardened electronics following a nuclear event. The First Generation (Technograph) Nuclear Event Detector (NED) provides an output that asserts in response to gamma radiation. This output can be used to protect electronic components. During gamma radiation, damage to both insulated gate (MOS) and PN junction (bipolar) devices may occur. The effects on electronic components can include, for example, reduction of gain, data corruption and the production of photocurrents which may cause latchup and burnout.
| Micross Components, Inc. | |
|---|---|
| Product Category | Radiation Detectors |
| Product Number | MP1336/002 |
| Product Name | First Generation NED (Technograph) |
| Detector Style | Detector Sensing Element Only |
