Information of the thermo physical properties of materials and heat transfer optimization of final products is becoming more and more vital for industrial applications.
Over the past few decades, the flash method has been developed into the most commonly used technique for the measurement of the thermal diffusivity and thermal conductivity of various kinds of solids, powders and liquids.
Thermophysical properties from thin-films are becoming more and more important in industries for products such as, phase-change optical disk media, thermoelectric materials, light emitting diodes (LEDs), phase change memories, flat panel displays and of curse all kinds of semiconductors. In all these cases, a thin film gets deposit on a substrate in order to give a device a particular function. Since the physical properties of these films differ from bulk material, these data are required for accurate thermal management predictions.
Based on the well established Laser Flash technique, the Linseis Laserflash for thin films (TF-LFA) now offers a whole range of new possibilities to analyze thermophysical properties of thin films from 80nm up to 20 μm thickness.
| Linseis Inc. | |
|---|---|
| Product Category | Calorimeters and Thermal Analyzers |
| Product Number | TF-LFA |
| Product Name | Laser Time Domain Thermoreflectance Analyzer |
| Thermal Analyzer Type | Thermal Conductivity |
| Properties Measured | Thermal Conductivity And Diffusivity |
| Thermal Analyzer Performance Specs | 0.01 mm2/s - 1000 mm2/s, Round or Square Samples |
