TSI Incorporated 1nm Scanning Mobility Particle Sizer Spectrometer 3938E57 3938E57

Take your measurements to the limit of detection with the 2nd generation of 1nm particle sizing. For more than 30 years, TSI's Scanning Mobility Particle Sizer™ (SMPS™) spectrometers have been widely used as the standard for measuring aerosol size distributions in the submicrometer and low nanometer size range. With the addition of the Nano Enhancer Model 3757 and Differentia l Mobility Analyzer Model 3086, you can now measure the size and number concentration with high resolution and speed, and monitor reaction kinetics and new particle formation of engineered and natural aerosol particles as small as 1nm. The 1nm SMPS system combines TSI's historical strengths in particle classification and counting, with new technology that permits the measurement of particles as small as 1nm. The optimized Differential Mobility Analyzer 3086 furthe r reduces diffusional losses of those smallest of particles. Between the DMA and a standard CPC, the NanoEnhancer Model 3757 uses diethylene glycol to pre-grow 1nm particles to enable detection by the CPC. The new Nano Enhancer design tightens the integration between CPC and Nano Enhancer and makes the setup and system use much easier. Combining these components allow researchers to move particle research into exciting new territory. Key applications are: Atmospheric Research - Monitor new particle formation and kinetics, cloud condensation, and close the gap between mass spectrometer and conventional particle size distribution measurements. Ideal for studies on sub-3 nm particles in highly polluted cities, particle sources and health effects studies. Material Science - Monitor and characterize sub-3 nm particles with reliable, near real-time feedback. This system is ideal for aerosol-based engineered nanoparticle synthesis, nanoparticle functionalization, nanoscale analytical chemistry, control of reaction kinetics and catalyst synthesis. The 1nm SMPS spectrometer is not just another detector that observes nucleation bursts from 1nm on; it is a full-blown particle spectrometer that shows which size distributions exist during these events, with an unmatched resolution. The modularity of components makes it easy to customize the system to best fit your measurement needs: saving you time and money. If you already own one of the 3938-series SMPS systems configured with a 3750 CPC, you only need to add the 1nm-DMA and the Nano Enhancer. Your Classifier and Advanced Neutralizer will remain the same, and you will get a free update to the latest version of Aerosol Instrument Manager® software. Applications Fundamental aerosol research Study of particle nucleation and particle growth, from particle sources such as flame synthesis, laser ablation, spark generation and nucleation/condensat ion Combustion and engine exhaust research, (organic fuels, sub-3nm emissions, natural gas engines, plastic molding and soldering) Filtration research Inhalation or exposure chamber studies Health effects studies *The Features & Benefits assume an SMPS spectrometer consisting of: 3082 Classifier, 1nm-DMA,  Model 3757 Nano Enhancer, and Conden sation Particle Counter 3750. Features & Benefits Fast, high resolution data on size and number concentration Optimized for minimal diffusion losses > 109 channels between 1 and 50 nm Ability to measure over three decades of size, from 1 nm to 1 µm, with the addition of the 3081A Long DMA Modular component design for customization to best fit the measurement needs, e.g. stand-alone use of the 1nm CPC Built-in diagnostics and auto detection of system components for reliable and reputable measurement data Easy to setup and use with Aerosol Instrument Manager® Software Discreet particle measurement: works well for multimodal samples