Phenom-World BV Datasheets for Ion Milling Systems

Ion milling systems use an ion beam to thin samples for transmission electron microscopy. Focused ion beam (FIB) systems use a narrow high current beam to mill specific regions or a low current beams to image samples (FIM).
Ion Milling Systems: Learn more

Product Name Notes
Desktop Scanning Electron Microscope -- Phenom Pro The Phenom Pro desktop SEM is one of the most advanced imaging models in the Phenom series. With its long-life high-brightness CeB6 electron source, the Phenom Pro creates state-of-the-art images...
Desktop Scanning Electron Microscope -- Phenom ProX The Phenom ProX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX desktop SEM, sample structures can be physically examined and their...
Desktop Scanning Electron Microscope -- Phenom Pure The Phenom Pure desktop SEM (scanning electron microscope) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom Pure...