JEOL USA, Inc. Datasheets for Electron Microscopes
Electron microscopes use a focused beam of electrons instead of light to "image" the specimen and gain information as to its structure and composition.
Electron Microscopes: Learn more
| Product Name | Notes |
|---|---|
| "NEOARM" / JEM-ARM200F comes with JEOL’s unique cold field emission gun (Cold FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold... | |
| Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications are expanding to not... | |
| CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography and MicroED. This system offers... | |
| Double Wien-filter monochromator for JEM-ARM200F is newly developed to realize ultra high energy resolution EELS analysis at atomic-scale. | |
| Features Automatic Observation and Analysis Function "Neo Action" SEM observation and EDS analysis can be automated by simply setting the analysis conditions and selecting the areas to measure. Sample: Chondrules... | |
| Features Compact With the drastic reduction in size, the JEM-120i has a filament replacing position and specimen holder insertion position lower than existing instruments. A newly developed cartridge type filament... | |
| Nowadays, not only resolution and analytical performance on the nanometer order, but also throughput in data acquisition are considered important. The newly born JSM-IT710HR is the fourth-generation model of JEOL's... | |
| The "GRAND ARM™2" has been upgraded. This new "GRAND ARM™2" enables observation at ultrahigh spatial resolution with highly sensitive analysis over a wide range of accelerating voltages. | |
| The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through... | |
| The JEM-ACE200F is an electron microscope responding to the system allowing for an operator to obtain data without operating the electron microscope by creating recipes for operation workflow. Since the... | |
| The JEM-F200 is a field emission transmission electron microscope, which features higher spatial resolution and analytical performance coupled with intuitive user interface for multi-purpose operation. | |
| The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, making it safer and faster to... |