The 3245 is a used analyzer from Wayne Kerr. Analyzers are key tools to test electronic equipment in the engineering, medical, automotive, and technological industries. Use analyzers for monitoring the performances of many different types of electronic devices. You may need analyzers for the measurement of components such as audio spectrums, voltages and currents, signals, and frequencies.
Additional Features:
Parameters: L, C, R, D, Q, Z, Angle øRdc Turns Ratio
AC-Stimulus Voltage (Programmable): 10 mV - 5V, 1mA - 100mA
Other Features: Stimulus Voltage and Current Display
DC Current: 1A max. Programmable, 20A x 3220A Bias Unit
Frequency (Programmable): 20 to 300 kHz
Basic Accuracy: 0.1%
Display: 7" Monitor, Parameter 5 digits
Controls: Soft-keys plus keypad
The unit combines in a single, highly intelligent and interactive benchtop unit, the capability to drive, bias, and measure inductances at a wide range of frequencies up to 300 kHz. Associated series and parallel resistance and capacitances are measured simultaneously, and associated "minor terms" - Q, D, phase angle, ratio, DC resistance, and Z - are automatically computed from this measurement.
The 3245 is a used analyzer from Wayne Kerr. Analyzers are key tools to test electronic equipment in the engineering, medical, automotive, and technological industries. Use analyzers for monitoring the performances of many different types of electronic devices. You may need analyzers for the measurement of components such as audio spectrums, voltages and currents, signals, and frequencies.
Additional Features:
- Parameters: L, C, R, D, Q, Z, Angle ØRdc Turns Ratio
- AC-Stimulus Voltage (Programmable): 10 mV - 5V, 1mA - 100mA
- Other Features: Stimulus Voltage and Current Display
- DC Current: 1A max. Programmable, 20A x 3220A Bias Unit
- Frequency (Programmable): 20 to 300 kHz
- Basic Accuracy: 0.1%
- Display: 7" Monitor, Parameter 5 digits
- Controls: Soft-keys plus keypad
The unit combines in a single, highly intelligent and interactive benchtop unit, the capability to drive, bias, and measure inductances at a wide range of frequencies up to 300 kHz. Associated series and parallel resistance and capacitances are measured simultaneously, and associated "minor terms" - Q, D, phase angle, ratio, DC resistance, and Z - are automatically computed from this measurement.
