The 4145A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
Additional Features:
Built-in graphics analysis functions including marker and cursor which provides direct numeric readouts and a line function for automatic calculation of line gradient and X-Y axis intercept values.
For greater versatility and capabilities the Agilent 4145A incorporates a built-in flexible disc drive for permanent storage of user programs and measurement results.
Four programmable stimulus/measurement units capable of high resolution plus wide range sourcing and sensing (1 pA to 100 mA; 1 mV to 100 V)
The Agilent 4145A semiconductor parameter analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, and ICs.
The 4145A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
Additional Features:
- Built-in graphics analysis functions including marker and cursor which provides direct numeric readouts and a line function for automatic calculation of line gradient and X-Y axis intercept values.
- For greater versatility and capabilities the Agilent 4145A incorporates a built-in flexible disc drive for permanent storage of user programs and measurement results.
- Four programmable stimulus/measurement units capable of high resolution plus wide range sourcing and sensing (1 pA to 100 mA; 1 mV to 100 V)
The Agilent 4145A semiconductor parameter analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, and ICs.
