The 4141B is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
Additional Features:
Designed for use as a system component in user-designed semiconductor I-V or DC parametric test systems
Wide DC measurement range, high resolution, high-speed measurement capabilities, remote sensing, and high accuracy
Will contribute towards quality improvement and increased measurement throughput in the lab or on the production line.
The unit is rated DC to ±100V @ 20mA
The Agilent 4141B pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.
The 4141B is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.
Additional Features:
- Designed for use as a system component in user-designed semiconductor I-V or DC parametric test systems
- Wide DC measurement range, high resolution, high-speed measurement capabilities, remote sensing, and high accuracy
- Will contribute towards quality improvement and increased measurement throughput in the lab or on the production line.
- The unit is rated DC to ±100V @ 20mA
The Agilent 4141B pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.
