ValueTronics International, Inc. Semiconductor Parameter Analyzer 4141A

Description
The 4141A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices. Additional Features: Designed for use as a system component in user designed semiconductor I-V or DC parametric test systems. Wide DC measurement range, high resolution, high speed measurement capabilities, remote sensing, and high accuracy Will contribute towards quality improvement The Agilent 4141A pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.
Description
The 4141A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices. Additional Features: Designed for use as a system component in user designed semiconductor I-V or DC parametric test systems. Wide DC measurement range, high resolution, high speed measurement capabilities, remote sensing, and high accuracy Will contribute towards quality improvement The Agilent 4141A pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.

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Product
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Semiconductor Parameter Analyzer - 4141A - ValueTronics International, Inc.
Elgin, IL, USA
Semiconductor Parameter Analyzer
4141A
Semiconductor Parameter Analyzer 4141A
The 4141A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices. Additional Features: Designed for use as a system component in user designed semiconductor I-V or DC parametric test systems. Wide DC measurement range, high resolution, high speed measurement capabilities, remote sensing, and high accuracy Will contribute towards quality improvement The Agilent 4141A pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.

The 4141A is a Semiconductor Parameter Analyzer from Agilent. Semiconductor parameter analyzers are all-in-one tools used for a wide range of measurement capabilities. Semiconductor parameter analyzers can measure and analyze electrical characterizations of many types of electronic devices, materials, active or passive components, semiconductors, or any other kind of electronic equipment. Engineers use this piece of test equipment for the monitoring of current and voltage responses in different types of devices.

Additional Features:

  • Designed for use as a system component in user designed semiconductor I-V or DC parametric test systems.
  • Wide DC measurement range, high resolution, high speed measurement capabilities, remote sensing, and high accuracy
  • Will contribute towards quality improvement

The Agilent 4141A pA Meter / DC Voltage Source consists of an extremely stable picoampere meter and two programmable DC voltage sources, one of which operates as a ramp and staircase generator as well as a DC source. These features make the unit ideal for making DC characteristic measurements such as leakage current, current-voltage characteristics and quasi-static C-V measurements required by the semiconductor industry for new product development and for improving production yields. It is equally useful in measurements of electronic components and materials to determine leakage currents or insulation resistances.

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Technical Specifications

  ValueTronics International, Inc.
Product Category Spectrum Analyzers and Signal Analyzers
Product Number 4141A
Product Name Semiconductor Parameter Analyzer
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