Texas Instruments Specialty Logic SNJ54BCT8374AFK

Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 28-LCCC (11.43x11.43)
  • Specialty Logic - SNJ54BCT8374AFK - Quarktwin Technology Ltd.
    Quarktwin Technology Ltd.
Datasheet
Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 28-LCCC (11.43x11.43)
Datasheet

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Specialty Logic - SNJ54BCT8374AFK - Quarktwin Technology Ltd.
Quarktwin Technology Ltd.
Shenzhen, Guangdong, China
Specialty Logic
SNJ54BCT8374AFK
Specialty Logic SNJ54BCT8374AFK
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 28-LCCC (11.43x11.43)

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 28-LCCC (11.43x11.43)

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Technical Specifications

  Quarktwin Technology Ltd.
Product Category Uncategorized Products
Product Number SNJ54BCT8374AFK
Product Name Specialty Logic
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