Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP
IC SCAN TEST DEVICE W/FF 24-DIP
| Quarktwin Technology Ltd. | Lingto Electronic Limited | |
|---|---|---|
| Product Category | Uncategorized Products | Uncategorized Products |
| Product Number | SN74BCT8374ANTG4 | SN74BCT8374ANTG4 |
| Product Name | Specialty Logic | Logic - Specialty Logic |