Texas Instruments Specialty Logic SN74BCT8374ADWR

Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
  • Specialty Logic - SN74BCT8374ADWR - Quarktwin Technology Ltd.
    Quarktwin Technology Ltd.
  • Logic - Specialty Logic - SN74BCT8374ADWR - Lingto Electronic Limited
    Lingto Electronic Limited
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Description
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
Datasheet

Suppliers

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Product
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Specialty Logic - SN74BCT8374ADWR - Quarktwin Technology Ltd.
Quarktwin Technology Ltd.
Shenzhen, Guangdong, China
Specialty Logic
SN74BCT8374ADWR
Specialty Logic SN74BCT8374ADWR
Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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Logic - Specialty Logic - SN74BCT8374ADWR - Lingto Electronic Limited
Lingto Electronic Limited
Shenzhen, China
Logic - Specialty Logic
SN74BCT8374ADWR
Logic - Specialty Logic SN74BCT8374ADWR
IC SCAN TEST DEVICE W/FF 24-SOIC

IC SCAN TEST DEVICE W/FF 24-SOIC

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Technical Specifications

  Quarktwin Technology Ltd. Lingto Electronic Limited
Product Category Uncategorized Products Uncategorized Products
Product Number SN74BCT8374ADWR SN74BCT8374ADWR
Product Name Specialty Logic Logic - Specialty Logic
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