EUV lithography and DSA haven been accepted by the industry as most promising candidates for dimensional scaling enablement at N7 technology node and beyond. This tutorial explains how introduction of such lithography technologies going to impact layout and circuit design. Choices of lithography would impact physical design and have a significant impact at system level. This tutorial will focus on transition from 193i multi-patterning technologies to EUV lithography and DSA. Factors that would determine on the enablement of these technologies would be highlighted and possible solutions would be shared.
| SPIE - Education | |
|---|---|
| Product Category | Technical Courses and Programs |
| Product Number | SC1187 |
| Product Name | Understanding Design-Patterning Interactions for EUV and DSA |
| Type | Course |