The course begins with an overview of basic aberrations and tolerance analysis in optical imaging systems. Zernike circle polynomials and their use in wavefront data analysis are presented as are analytical methods for cases involving non-circular pupils such as annular, square, hexagonal and elliptical pupils. The calculation of orthonormal aberration coefficients from the wavefront error data obtained by phase-shifting interferometery or wavefront slope error data obtained with a Shack-Hartmann sensor is explained, and numerical analyses of both types of data are demonstrated. The course begins with an overview of basic aberrations and tolerance analysis in optical imaging systems. Zernike circle polynomials and their use in wavefront data analysis are presented as are analytical methods for cases involving non-circular pupils such as annular, square, hexagonal and elliptical pupils. The calculation of orthonormal aberration coefficients from the wavefront error data obtained by phase-shifting interferometery or wavefront slope error data obtained with a Shack-Hartmann sensor is explained, and numerical analyses of both types of data are demonstrated.
| SPIE - Education | |
|---|---|
| Product Category | Technical Courses and Programs |
| Product Number | SC1164 |
| Product Name | Wavefront Data Analysis |
| Type | Continuing Education Credit (CEU)?; Course |
