SPIE Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI ISBN: 9780819488930

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Proceedings of SPIE Volume 8250 Editor(s): Sonia M. Garca-Blanco ; Rajeshuni Ramesham Date Published: 16 March 2012
  • Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI - ISBN: 9780819488930 - SPIE
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Proceedings of SPIE Volume 8250 Editor(s): Sonia M. Garca-Blanco ; Rajeshuni Ramesham Date Published: 16 March 2012

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI - ISBN: 9780819488930 - SPIE
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
ISBN: 9780819488930
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI ISBN: 9780819488930
Proceedings of SPIE Volume 8250 Editor(s): Sonia M. Garca-Blanco ; Rajeshuni Ramesham Date Published: 16 March 2012

Proceedings of SPIE Volume 8250
Editor(s): Sonia M. Garca-Blanco ; Rajeshuni Ramesham
Date Published: 16 March 2012

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Product Category Standards and Technical Documents
Product Number ISBN: 9780819488930
Product Name Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
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