SPIE Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X ISBN: 9780819484659

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Proceedings of SPIE Volume 7928 Editor(s): Sonia Garcia-Blanco ; Rajeshuni Ramesham Date Published: 11 February 2011
  • Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X - ISBN: 9780819484659 - SPIE
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Proceedings of SPIE Volume 7928 Editor(s): Sonia Garcia-Blanco ; Rajeshuni Ramesham Date Published: 11 February 2011

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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X - ISBN: 9780819484659 - SPIE
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Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
ISBN: 9780819484659
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X ISBN: 9780819484659
Proceedings of SPIE Volume 7928 Editor(s): Sonia Garcia-Blanco ; Rajeshuni Ramesham Date Published: 11 February 2011

Proceedings of SPIE Volume 7928
Editor(s): Sonia Garcia-Blanco ; Rajeshuni Ramesham
Date Published: 11 February 2011

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Product Category Standards and Technical Documents
Product Number ISBN: 9780819484659
Product Name Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
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