Proceedings of SPIE Volume 7729
Editor(s): Michael T. Postek ; Dale E. Newbury ; S. Frank Platek; David C. Joy
Date Published: 2 June 2010
| SPIE | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Number | ISBN: 9780819482174 |
| Product Name | Scanning Microscopy 2010 |
