SPIE Instrumentation, Metrology, and Standards for Nanomanufacturing ISBN: 9780819467966

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Proceedings of SPIE Volume 6648 Editor(s): Michael T. Postek ; John A. Allgair Date Published: 10 September 2007
  • Instrumentation, Metrology, and Standards for Nanomanufacturing - ISBN: 9780819467966 - SPIE
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Description
Proceedings of SPIE Volume 6648 Editor(s): Michael T. Postek ; John A. Allgair Date Published: 10 September 2007

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Instrumentation, Metrology, and Standards for Nanomanufacturing - ISBN: 9780819467966 - SPIE
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Instrumentation, Metrology, and Standards for Nanomanufacturing
ISBN: 9780819467966
Instrumentation, Metrology, and Standards for Nanomanufacturing ISBN: 9780819467966
Proceedings of SPIE Volume 6648 Editor(s): Michael T. Postek ; John A. Allgair Date Published: 10 September 2007

Proceedings of SPIE Volume 6648
Editor(s): Michael T. Postek ; John A. Allgair
Date Published: 10 September 2007

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  SPIE
Product Category Standards and Technical Documents
Product Number ISBN: 9780819467966
Product Name Instrumentation, Metrology, and Standards for Nanomanufacturing
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