Proceedings of SPIE Volume 5920
Editor(s): Zenghu Chang ; Jean-Claude Kieffer ; Jerome B. Hastings ; Stuart Kleinfelder ; Dennis L. Paisley
Date Published: 18 August 2005
| SPIE | |
|---|---|
| Product Category | Standards and Technical Documents |
| Product Number | ISBN: 9780819459251 |
| Product Name | Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications |