Shimadzu Scientific Instruments, Inc. X-ray Fluorescence Spectrometer EDX-LE

Description
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive. The model is recommended for taking measures for step 2 of China RoHS. Lower operation cost, easier maintenance Provides specific functions necessary for screening the five RoHS regulated elements Easy set-up functions can be customized according to the management method Easy operation from the [Screening Analysis] window All steps are automatically set from the the evaluation of major components to selection of conditions Functions necessary for RoHS/ELV analysis are provided as standard A large sample chamber enables measurements of large samples
Description
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive. The model is recommended for taking measures for step 2 of China RoHS. Lower operation cost, easier maintenance Provides specific functions necessary for screening the five RoHS regulated elements Easy set-up functions can be customized according to the management method Easy operation from the [Screening Analysis] window All steps are automatically set from the the evaluation of major components to selection of conditions Functions necessary for RoHS/ELV analysis are provided as standard A large sample chamber enables measurements of large samples

Suppliers

Company
Product
Description
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X-ray Fluorescence Spectrometer - EDX-LE - Shimadzu Scientific Instruments, Inc.
Columbia, MD, USA
X-ray Fluorescence Spectrometer
EDX-LE
X-ray Fluorescence Spectrometer EDX-LE
EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability. The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive. The model is recommended for taking measures for step 2 of China RoHS. Lower operation cost, easier maintenance Provides specific functions necessary for screening the five RoHS regulated elements Easy set-up functions can be customized according to the management method Easy operation from the [Screening Analysis] window All steps are automatically set from the the evaluation of major components to selection of conditions Functions necessary for RoHS/ELV analysis are provided as standard A large sample chamber enables measurements of large samples

EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. The model uses a detector (Si-PIN semiconductor detector) that does not require liquid nitrogen, thereby achieving lower operation cost and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.
The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive. The model is recommended for taking measures for step 2 of China RoHS.

  • Lower operation cost, easier maintenance
  • Provides specific functions necessary for screening the five RoHS regulated elements
  • Easy set-up functions can be customized according to the management method
  • Easy operation from the [Screening Analysis] window
  • All steps are automatically set from the the evaluation of major components to selection of conditions
  • Functions necessary for RoHS/ELV analysis are provided as standard
  • A large sample chamber enables measurements of large samples
Supplier's Site

Technical Specifications

  Shimadzu Scientific Instruments, Inc.
Product Category X-Ray Fluorescence Spectrometers
Product Number EDX-LE
Product Name X-ray Fluorescence Spectrometer
Module Type Energy Dispersive
Excitation Source X-Ray Tubes
Display None
General Features Programmable
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