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Rigaku Corporation Parallel Beam Graded Multilayer Monochromator Max-Flux® XRD

Description
Introduced by Rigaku Innovative Technologies in the early 1990’s, graded multilayer monochromators provide increased intensity for High-Resolution diffraction, Thin Film analysis and other 1-dimensional parallel beam XRD applications. Max-Flux® Optics use graded multilayers, assuring the same X-ray energy diffracts from every point along the surface of the Parabolic optic. Rigaku’s Osmic® Coating technology provides results in less than 0.5% d-spacing variation. Such high precision means more flux is available for your experiment. Optical precision is also critical to good performance. Using proprietary technology, standard Max-Flux optics are made within ~10 arcsec of the ideal curve. When the best performance is required, Rigaku applies new Arc)Sec® technology to achieve optical precision of ≤ 4 arcsec! As a 1-dimensional optic, divergence in the axial plane can be controlled through use of a Soller collimator. Contact Rigaku for a suitable collimator for your application. Rigaku provides excellent housings for aligning Max-Flux optics on your instrument. Housing are available for operation in atmosphere or vacuum, for 40mm, 60mm, 80mm, 100mm and 120mm long optics.

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Parallel Beam Graded Multilayer Monochromator - Max-Flux® XRD - Rigaku Corporation
The Woodlands, TX, USA
Parallel Beam Graded Multilayer Monochromator
Max-Flux® XRD
Parallel Beam Graded Multilayer Monochromator Max-Flux® XRD
Introduced by Rigaku Innovative Technologies in the early 1990’s, graded multilayer monochromators provide increased intensity for High-Resolution diffraction, Thin Film analysis and other 1-dimensional parallel beam XRD applications. Max-Flux® Optics use graded multilayers, assuring the same X-ray energy diffracts from every point along the surface of the Parabolic optic. Rigaku’s Osmic® Coating technology provides results in less than 0.5% d-spacing variation. Such high precision means more flux is available for your experiment. Optical precision is also critical to good performance. Using proprietary technology, standard Max-Flux optics are made within ~10 arcsec of the ideal curve. When the best performance is required, Rigaku applies new Arc)Sec® technology to achieve optical precision of ≤ 4 arcsec! As a 1-dimensional optic, divergence in the axial plane can be controlled through use of a Soller collimator. Contact Rigaku for a suitable collimator for your application. Rigaku provides excellent housings for aligning Max-Flux optics on your instrument. Housing are available for operation in atmosphere or vacuum, for 40mm, 60mm, 80mm, 100mm and 120mm long optics.

Introduced by Rigaku Innovative Technologies in the early 1990’s, graded multilayer monochromators provide increased intensity for High-Resolution diffraction, Thin Film analysis and other 1-dimensional parallel beam XRD applications.

Max-Flux® Optics use graded multilayers, assuring the same X-ray energy diffracts from every point along the surface of the Parabolic optic.

Rigaku’s Osmic® Coating technology provides results in less than 0.5% d-spacing variation. Such high precision means more flux is available for your experiment.

Optical precision is also critical to good performance. Using proprietary technology, standard Max-Flux optics are made within ~10 arcsec of the ideal curve. When the best performance is required, Rigaku applies new Arc)Sec® technology to achieve optical precision of ≤ 4 arcsec!

As a 1-dimensional optic, divergence in the axial plane can be controlled through use of a Soller collimator. Contact Rigaku for a suitable collimator for your application.

Rigaku provides excellent housings for aligning Max-Flux optics on your instrument. Housing are available for operation in atmosphere or vacuum, for 40mm, 60mm, 80mm, 100mm and 120mm long optics.

Supplier's Site

Technical Specifications

  Rigaku Corporation
Product Category Monochromators
Product Number Max-Flux® XRD
Product Name Parallel Beam Graded Multilayer Monochromator
Monochromator Features Vacuum
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