The new inVia Qontor is Renishaw's most advanced Raman microscope. With the addition of Renishaw's latest innovation, LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.
The inVia Qontor Raman microscope's cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy.
The highly efficient optical design gives you the best Raman data, from minute traces of material and large volumes. Apply this power to your experiments, running measurements such as:
time series: monitor how your sample is altering with time
temperature ramps: use a hot/cold cell to see phase changes
line scans: profile your sample, both across the surface, or into its depth
area mapping: generate images, either horizontally at fixed focus, following the surface topography, or from vertical slices
volume scans: produce 3D views of your transparent sample's internal structure
transmission mapping: analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
specialist measurements: trigger data collection from your own equipment (such as a control system on a synchrotron beamline)
Make full use of inVia WiRE software: collect the data you want, and analyse and display it in the way that suits you best.
The new inVia Qontor is Renishaw's most advanced Raman microscope. With the addition of Renishaw's latest innovation, LiveTrack™ focus tracking technology, the inVia Qontor enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.
The inVia Qontor Raman microscope's cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy.
The highly efficient optical design gives you the best Raman data, from minute traces of material and large volumes. Apply this power to your experiments, running measurements such as:
- time series: monitor how your sample is altering with time
- temperature ramps: use a hot/cold cell to see phase changes
- line scans: profile your sample, both across the surface, or into its depth
- area mapping: generate images, either horizontally at fixed focus, following the surface topography, or from vertical slices
- volume scans: produce 3D views of your transparent sample's internal structure
- transmission mapping: analyse large volumes of material and produce depth-averaged 2D images of bulk material homogeneity
- specialist measurements: trigger data collection from your own equipment (such as a control system on a synchrotron beamline)
Make full use of inVia WiRE software: collect the data you want, and analyse and display it in the way that suits you best.