Renesas Electronics Corporation Quad 18V Pin Electronics Driver/Window Comparator ISL55100BIRZ

Description
The ISL55100B is a Quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn-In (TDBI) applications, where cost, functional density and power are all at a premium. This IC incorporates four channels of programmable drivers and window comparators into a small 72 Ld QFN package. Each channel has independent driver levels, data and high impedance control. Each receiver has dual comparators, which provide high and low threshold levels. The ISL55100B uses differential mode digital inputs and can therefore mate directly with LVDS or CML outputs. Single-ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4V for TTL compatibility). The comparator outputs are single-ended and the output levels are user defined to mate directly with any digital technology. The 18V driver output and receiver input ranges allow this device to interface directly with TTL, ECL, CMOS (3V, 5V and 7V), LVCMOS and custom level circuitry, as well as the high voltage (super voltage) level required for many special test modes for Flash Devices.
Description
The ISL55100B is a Quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn-In (TDBI) applications, where cost, functional density and power are all at a premium. This IC incorporates four channels of programmable drivers and window comparators into a small 72 Ld QFN package. Each channel has independent driver levels, data and high impedance control. Each receiver has dual comparators, which provide high and low threshold levels. The ISL55100B uses differential mode digital inputs and can therefore mate directly with LVDS or CML outputs. Single-ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4V for TTL compatibility). The comparator outputs are single-ended and the output levels are user defined to mate directly with any digital technology. The 18V driver output and receiver input ranges allow this device to interface directly with TTL, ECL, CMOS (3V, 5V and 7V), LVCMOS and custom level circuitry, as well as the high voltage (super voltage) level required for many special test modes for Flash Devices.
Datasheet
Datasheet Summary
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The ISL55100BIRZ is a quad pin driver and window comparator designed for Test During Burn-In (TDBI) applications, featuring a wide voltage CMOS process. It integrates four channels of programmable drivers and window comparators within a compact 72-lead QFN package. Each channel offers independent driver levels, data, and high impedance control, along with dual comparators for high and low threshold levels. This device supports differential mode digital inputs, making it compatible with LVDS or CML outputs, and can also accommodate single-ended logic families by connecting one input to a suitable threshold voltage. The output levels of the comparators are user-defined, allowing for direct interfacing with various digital technologies, including TTL, ECL, and CMOS. The ISL55100BIRZ operates within an 18V I/O range and can function at frequencies up to 50MHz, making it suitable for applications such as burn-in ATE, wafer-level flash memory testing, and LCD panel testing. The product is RoHS compliant and features low driver output resistance and minimal channel-to-channel timing skew.

Datasheet Summary
Powered by GS/AI

The ISL55100BIRZ is a quad pin driver and window comparator designed for Test During Burn-In (TDBI) applications, featuring a wide voltage CMOS process. It integrates four channels of programmable drivers and window comparators within a compact 72-lead QFN package. Each channel offers independent driver levels, data, and high impedance control, along with dual comparators for high and low threshold levels. This device supports differential mode digital inputs, making it compatible with LVDS or CML outputs, and can also accommodate single-ended logic families by connecting one input to a suitable threshold voltage. The output levels of the comparators are user-defined, allowing for direct interfacing with various digital technologies, including TTL, ECL, and CMOS. The ISL55100BIRZ operates within an 18V I/O range and can function at frequencies up to 50MHz, making it suitable for applications such as burn-in ATE, wafer-level flash memory testing, and LCD panel testing. The product is RoHS compliant and features low driver output resistance and minimal channel-to-channel timing skew.

Suppliers

Company
Product
Description
Supplier Links
Quad 18V Pin Electronics Driver/Window Comparator - ISL55100BIRZ - Renesas Electronics Corporation
Milpitas, CA, USA
Quad 18V Pin Electronics Driver/Window Comparator
ISL55100BIRZ
Quad 18V Pin Electronics Driver/Window Comparator ISL55100BIRZ
The ISL55100B is a Quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn-In (TDBI) applications, where cost, functional density and power are all at a premium. This IC incorporates four channels of programmable drivers and window comparators into a small 72 Ld QFN package. Each channel has independent driver levels, data and high impedance control. Each receiver has dual comparators, which provide high and low threshold levels. The ISL55100B uses differential mode digital inputs and can therefore mate directly with LVDS or CML outputs. Single-ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4V for TTL compatibility). The comparator outputs are single-ended and the output levels are user defined to mate directly with any digital technology. The 18V driver output and receiver input ranges allow this device to interface directly with TTL, ECL, CMOS (3V, 5V and 7V), LVCMOS and custom level circuitry, as well as the high voltage (super voltage) level required for many special test modes for Flash Devices.

The ISL55100B is a Quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn-In (TDBI) applications, where cost, functional density and power are all at a premium.
This IC incorporates four channels of programmable drivers and window comparators into a small 72 Ld QFN package. Each channel has independent driver levels, data and high impedance control. Each receiver has dual comparators, which provide high and low threshold levels.
The ISL55100B uses differential mode digital inputs and can therefore mate directly with LVDS or CML outputs. Single-ended logic families are handled by connecting one of the digital input pins to an appropriate threshold voltage (e.g., 1.4V for TTL compatibility). The comparator outputs are single-ended and the output levels are user defined to mate directly with any digital technology.
The 18V driver output and receiver input ranges allow this device to interface directly with TTL, ECL, CMOS (3V, 5V and 7V), LVCMOS and custom level circuitry, as well as the high voltage (super voltage) level required for many special test modes for Flash Devices.

Supplier's Site Datasheet
Logic - Specialty Logic - ISL55100BIRZ - Lingto Electronic Limited
Shenzhen, China
Logic - Specialty Logic
ISL55100BIRZ
Logic - Specialty Logic ISL55100BIRZ
IC COMP DRVR/WINDOW 18V 72-QFN

IC COMP DRVR/WINDOW 18V 72-QFN

Supplier's Site Datasheet
Specialty Logic - ISL55100BIRZ - Quarktwin Technology Ltd.
Shenzhen, Guangdong, China
Specialty Logic
ISL55100BIRZ
Specialty Logic ISL55100BIRZ
Comparator, Driver IC 72-QFN (10x10)

Comparator, Driver IC 72-QFN (10x10)

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Technical Specifications

  Renesas Electronics Corporation Lingto Electronic Limited Quarktwin Technology Ltd.
Product Category Uncategorized Products Uncategorized Products Uncategorized Products
Product Number ISL55100BIRZ ISL55100BIRZ ISL55100BIRZ
Product Name Quad 18V Pin Electronics Driver/Window Comparator Logic - Specialty Logic Specialty Logic
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