CHRocodile IT TW
Application: Non-contact thickness measurement of Thin Wafer
High measuring rate
nm resolution
Transparent coatings/foils from 3.5 up to 250 µm
Precitec, Inc.
Done
Description
CHRocodile IT TW
Application: Non-contact thickness measurement of Thin Wafer
High measuring rate
nm resolution
Transparent coatings/foils from 3.5 up to 250 µm
CHRocodile IT TW
Application: Non-contact thickness measurement of Thin Wafer
High measuring rate
nm resolution
Transparent coatings/foils from 3.5 up to 250 µm
CHRocodile IT TW
Application: Non-contact thickness measurement of Thin Wafer