Polytec, Inc. Optical Surface Profilometry TMS-320

Description
Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available sample areas range from a rectangular 4.2 mm x 5.5 mm to a circular diameter of 19 mm.
  • Optical Surface Profilometry - TMS-320 - Polytec, Inc.
    Polytec, Inc.
Description
Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available sample areas range from a rectangular 4.2 mm x 5.5 mm to a circular diameter of 19 mm.

Suppliers

Company
Product
Description
Supplier Links
Optical Surface Profilometry - TMS-320 - Polytec, Inc.
Polytec, Inc.
Irvine, CA, USA
Optical Surface Profilometry
TMS-320
Optical Surface Profilometry TMS-320
Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available sample areas range from a rectangular 4.2 mm x 5.5 mm to a circular diameter of 19 mm.

Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available sample areas range from a rectangular 4.2 mm x 5.5 mm to a circular diameter of 19 mm.

Technical Specifications

  Polytec, Inc.
Product Category Surface Metrology Equipment
Product Number TMS-320
Product Name Optical Surface Profilometry
Measurement Capability Area or three dimensional profile; Flatness; Parallelism; Roundness
Unlock Full Specs
to access all available technical data

Similar Products

High-performance green laser scanners with 4K resolution - scanCONTROL LLT8500-50 - Micro-Epsilon Group
Micro-Epsilon Group
High-performance green laser scanners with 4K resolution
scanCONTROL LLT8500-50
Specs
Measurement Capability Form; Surface Profilometry; 2D / Line Profile; Area or three dimensional profile; Flatness; Parallelism; Squareness / Angularity; Step Height; Thickness; Straightness; Roundness; Defects, dimples or film residues; Warp / Bow
Technology Optical / Laser
Applications Aerospace / Defense; Automotive; Bearings, Gears, Shafting, Seals, etc.; Flat Panel Display; MEMS; Precision Machining / Grinding; Semiconductors; Coatings / Films; Electronics; Medical; Production or Factory Use
View Details
5-axis Measurement System - REVO - Renishaw
Renishaw
5-axis Measurement System
REVO
Specs
Measurement Capability Surface Profilometry
Technology Optical / Laser
Applications Precision Machining / Grinding
View Details
Roughness Tester - PCE-RT 11 - PCE Instruments / PCE Americas Inc.
PCE Instruments / PCE Americas Inc.
Roughness Tester
PCE-RT 11
Specs
Measurement Capability Surface Profilometry; Roughness
Technology Contact / Stylus
Operating Temperature -4 to 104 F (-20 to 40 C)
View Details
Metrology Systems - Compass™ 2 - Zygo Corporation
Zygo Corporation
Metrology Systems
Compass™ 2
Specs
Measurement Capability Form; Surface Profilometry; Area or three dimensional profile
Mounting / Loading Options Floor
View Details