Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available sample areas range from a rectangular 4.2 mm x 5.5 mm to a circular diameter of 19 mm.
| Polytec, Inc. | |
|---|---|
| Product Category | Surface Metrology Equipment |
| Product Number | TMS-320 |
| Product Name | Optical Surface Profilometry |
| Measurement Capability | Area or three dimensional profile; Flatness; Parallelism; Roundness |
