Polytec, Inc. Optical Surface Profilometry TMS-1200

Description
The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements.
  • Optical Surface Profilometry - TMS-1200 - Polytec, Inc.
    Polytec, Inc.
Description
The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements.

Suppliers

Company
Product
Description
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Optical Surface Profilometry - TMS-1200 - Polytec, Inc.
Polytec, Inc.
Irvine, CA, USA
Optical Surface Profilometry
TMS-1200
Optical Surface Profilometry TMS-1200
The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements.

The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements.

Supplier's Site

Technical Specifications

  Polytec, Inc.
Product Category Surface Metrology Equipment
Product Number TMS-1200
Product Name Optical Surface Profilometry
Measurement Capability Area or three dimensional profile; Flatness; Parallelism; Roundness
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