Polytec, Inc. Microscope Scanning Vibrometer MSV-400

Description
The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution of down to 1 µm. MSV-400 can achieve picometer vibration resolution and up to 20 MHz bandwidth.
Description
The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution of down to 1 µm. MSV-400 can achieve picometer vibration resolution and up to 20 MHz bandwidth.

Suppliers

Company
Product
Description
Supplier Links
Microscope Scanning Vibrometer - MSV-400 - Polytec, Inc.
Irvine, CA, USA
Microscope Scanning Vibrometer
MSV-400
Microscope Scanning Vibrometer MSV-400
The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution of down to 1 µm. MSV-400 can achieve picometer vibration resolution and up to 20 MHz bandwidth.

The MSV-400 Microscope Scanning Vibrometer is the successor to the award-winning MSV-300 for full-field vibration analysis of very small objects such as MEMS optical switches. Based on the laser Doppler principle, a HeNe laser maps the vibrational response of the structure with a lateral resolution of down to 1 µm. MSV-400 can achieve picometer vibration resolution and up to 20 MHz bandwidth.

Technical Specifications

  Polytec, Inc.
Product Category Microscopes
Product Number MSV-400
Product Name Microscope Scanning Vibrometer
Application Measuring / Toolmaker / Inspection; Semiconductor; Microscope Scanning Vibrometer
Grade Benchtop; Research
Microscope Type Scanning Probe / Atomic Force
Features Digital Display
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