Park Systems, Inc. XE-NSOM


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XE-NSOM -  - Park Systems, Inc.
Santa Clara, CA, USA
The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM), Raman Spectrometry, and Confocal Microscopy. The XE-NSOM provides a complete AFM system setup with unsurpassed versatility for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology. • Seamless integration of AFM and optical measurements • Optical head design allows wide angle access to samples • Versatile platform supports various reflection & transmission modes • Easy alignment of optical axes to photon detection system • Upgradeable modular design for AFM, NSOM, Raman, and more

Technical Specifications

  Park Systems, Inc.
Product Category Microscopes
Product Name XE-NSOM
Microscope Type Scanning Probe / Atomic Force
Optical Technique Near-field Scanning Optical Microscopy
Remote Interface Application Software Included.
Grade Benchtop
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