The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM), Raman Spectrometry, and Confocal Microscopy. The XE-NSOM provides a complete AFM system setup with unsurpassed versatility for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology.
• Seamless integration of AFM and optical measurements
• Optical head design allows wide angle access to samples
• Versatile platform supports various reflection & transmission modes
• Easy alignment of optical axes to photon detection system
• Upgradeable modular design for AFM, NSOM, Raman, and more
| Park Systems, Inc. | |
|---|---|
| Product Category | Microscopes |
| Product Name | XE-NSOM |
| Application | Biological / Life Sciences |
| Grade | Benchtop |
| Microscope Type | Scanning Probe / Atomic Force |
| Optical Technique | Near-field Scanning Optical Microscopy |
