Park Systems, Inc. XE-70

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XE-70 -  - Park Systems, Inc.
Santa Clara, CA, USA
XE-70
XE-70 is Park Systems’ AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line. Artifact Free Imaging by Crosstalk Elimination • Two independent, closed- loop XY and Z flexure scanners for sample and tip • Flat and linear XY scan of up to 100 μm x 100 μm with low residual bow • Out of plane motion of less than 2 nm over entire scan range • Up to 25 μm Z-scan by high force scanner • Accurate height measurements Ultimate AFM Resolution by True Non-Contact Mode • 10 times larger Z-scan bandwidth than a piezotube • Less tip wear for prolonged high-quality and high-resolution imaging • Minimized sample damage or modification • Immunity from parameter-dependent results observed in tapping imaging User Convenience by EZ Design • Open side access for easy sample or tip exchange • Dovetail-lock mount for easy head removal • Direct on-axis optics for high resolution optical viewing

Technical Specifications

  Park Systems, Inc.
Product Category Microscopes
Product Name XE-70
Microscope Type Scanning Probe / Atomic Force
Remote Interface Application Software Included.
Grade Benchtop; Research
Features Digital Display; Mechanical Stage; Monocular
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