Park Systems, Inc. XE-70

XE-70 is Park Systems’ AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line. Artifact Free Imaging by Crosstalk Elimination • Two independent, closed- loop XY and Z flexure scanners for sample and tip • Flat and linear XY scan of up to 100 μm x 100 μm with low residual bow • Out of plane motion of less than 2 nm over entire scan range • Up to 25 μm Z-scan by high force scanner • Accurate height measurements Ultimate AFM Resolution by True Non-Contact Mode • 10 times larger Z-scan bandwidth than a piezotube • Less tip wear for prolonged high-quality and high-resolution imaging • Minimized sample damage or modification • Immunity from parameter-dependent results observed in tapping imaging User Convenience by EZ Design • Open side access for easy sample or tip exchange • Dovetail-lock mount for easy head removal • Direct on-axis optics for high resolution optical viewing