Park Systems, Inc. XE-120

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XE-120 -  - Park Systems, Inc.
Santa Clara, CA, USA
XE-120
Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry’s only True Non-Contact mode imaging for both air and liquid imaging. Flexible configurations allow integration with other advanced optical measurement techniques such as Raman spectroscopy. Artifact Free Imaging by Crosstalk Elimination • Two independent, closed- loop XY and Z flexure scanners for sample and tip • Out of plane motion of less than 2 nm over entire scan range • Flat and linear XY scan of up to 100 μm x 100 μm with low residual bow • Up to 25 μm Z-scan by high force scanner • Accurate height measurements Ultimate AFM Resolution by True Non-Contact Mode • 10 times larger Z-scan bandwidth than a piezotube • Less tip wear for prolonged high-quality and high-resolution imaging • Minimized sample damage or modification • Immunity from parameter-dependent results observed in tapping imaging User Convenience by EZ Design • Open side access for easy sample or tip exchange • Dovetail-lock mount for easy head removal • Direct on-axis optics for high resolution optical viewing • Motorized optics stage Advanced Optical Integration and Option Compatibility • Integrated with inverted optical microscopes • Tight mechanical coupling yields excellent noise performance • Compatible with both reflection and transmission optical viewing • Open side access for optical coupling such as Raman spectroscopy for TERS • Access to all advanced SPM modes and options

Technical Specifications

  Park Systems, Inc.
Product Category Microscopes
Product Name XE-120
Microscope Type Scanning Probe / Atomic Force
Eyepiece Style Binocular
Remote Interface Application Software Included.
Grade Benchtop; Research
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