With its EFI (Extended Focal Image) capability, the DSX510 can obtain a clear, in-focus image of an entire sample with one click — no matter how uneven the surface. During EFI, several images are taken while the point of focus is moved up and down. From these images, the areas where the sample was in focus are combined into one image where the whole sample is in focus, allowing precise inspection of uneven surfaces. Olympus’s EFI capturing speed is now faster than ever.
|Product Name||Industrial Microscope|
|Optical Technique||Brightfield, Darkfield, MIX [BF + DF], Differential Interference Contrast, Polarized Light|
|Eyepiece Style||Computer Display|
|Remote Interface||Computer Interface; Application Software Included.|