The 74LVC1G80-Q100 is a single positive-edge triggered D-type flip-flop. Data at the D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition will be stored in the flip-flop and its complement will appear at the Q output. Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of these devices as translators in mixed 3.3 V and 5 V environments.
Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times.
This device is fully specified for partial power down applications using IOFF. The IOFF circuitry disables the output, preventing the potentially damaging backflow current through the device when it is powered down.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from -40 °C to +85 °C and -40 °C to +125 °C Wide supply voltage range from 1.65 V to 5.5 V Overvoltage tolerant inputs to 5.5 V High noise immunity ±24 mA output drive (VCC = 3.0 V) CMOS low power dissipation Direct interface with TTL levels IOFF circuitry provides partial Power-down mode operation Latch-up performance exceeds 250 mA Complies with JEDEC standard: JESD8-7 (1.65 V to 1.95 V) JESD8-5 (2.3 V to 2.7 V) JESD8C (2.7 V to 3.6 V) JESD36 (4.5 V to 5.5 V) ESD protection: MIL-STD-883, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
The 74LVC1G80-Q100 is a single positive-edge triggered D-type flip-flop. Data at the D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition will be stored in the flip-flop and its complement will appear at the Q output. Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of these devices as translators in mixed 3.3 V and 5 V environments.
Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times.
This device is fully specified for partial power down applications using IOFF. The IOFF circuitry disables the output, preventing the potentially damaging backflow current through the device when it is powered down.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits
- Automotive product qualification in accordance with AEC-Q100 (Grade 1)
- Specified from -40 °C to +85 °C and -40 °C to +125 °C
- Wide supply voltage range from 1.65 V to 5.5 V
- Overvoltage tolerant inputs to 5.5 V
- High noise immunity
- ±24 mA output drive (VCC = 3.0 V)
- CMOS low power dissipation
- Direct interface with TTL levels
- IOFF circuitry provides partial Power-down mode operation
- Latch-up performance exceeds 250 mA
- Complies with JEDEC standard:
- JESD8-7 (1.65 V to 1.95 V)
- JESD8-5 (2.3 V to 2.7 V)
- JESD8C (2.7 V to 3.6 V)
- JESD36 (4.5 V to 5.5 V)
- ESD protection:
- MIL-STD-883, method 3015 exceeds 2000 V
- HBM JESD22-A114F exceeds 2000 V
- MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
