The 74AUP1G74-Q100 is a single positive edge triggered D-type flip-flop with individual data (D), clock (CP), set (SD) and reset (RD) inputs, and complementary Q and Q outputs. Data at the D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition will be stored in the flip-flop and appear at the Q output.
Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times.
This device ensures very low static and dynamic power consumption across the entire VCC range from 0.8 V to 3.6 V.
This device is fully specified for partial power down applications using IOFF. The IOFF circuitry disables the output, preventing the potentially damaging backflow current through the device when it is powered down.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from -40 °C to +85 °C and from -40 °C to +125 °C Wide supply voltage range from 0.8 V to 3.6 V CMOS low power dissipation High noise immunity Overvoltage tolerant inputs to 3.6 V Low static power consumption; ICC = 0.9 μA (maximum) Latch-up performance exceeds 100 mA per JESD 78 Class II Low noise overshoot and undershoot < 10 % of VCC IOFF circuitry provides partial Power-down mode operation Complies with JEDEC standards: JESD8-12 (0.8 V to 1.3 V) JESD8-11 (0.9 V to 1.65 V) JESD8-7 (1.2 V to 1.95 V) JESD8-5 (1.8 V to 2.7 V) JESD8C (2.7 V to 3.6 V) ESD protection: MIL-STD-883, method 3015 Class 3A. Exceeds 5 kV HBM JESD22-A114F Class 3A. Exceeds 5 kV MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
The 74AUP1G74-Q100 is a single positive edge triggered D-type flip-flop with individual data (D), clock (CP), set (SD) and reset (RD) inputs, and complementary Q and Q outputs. Data at the D-input that meets the set-up and hold time requirements on the LOW-to-HIGH clock transition will be stored in the flip-flop and appear at the Q output.
Schmitt-trigger action at all inputs makes the circuit tolerant of slower input rise and fall times.
This device ensures very low static and dynamic power consumption across the entire VCC range from 0.8 V to 3.6 V.
This device is fully specified for partial power down applications using IOFF. The IOFF circuitry disables the output, preventing the potentially damaging backflow current through the device when it is powered down.
This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications.
Features and benefits
- Automotive product qualification in accordance with AEC-Q100 (Grade 1)
- Specified from -40 °C to +85 °C and from -40 °C to +125 °C
- Wide supply voltage range from 0.8 V to 3.6 V
- CMOS low power dissipation
- High noise immunity
- Overvoltage tolerant inputs to 3.6 V
- Low static power consumption; ICC = 0.9 μA (maximum)
- Latch-up performance exceeds 100 mA per JESD 78 Class II
- Low noise overshoot and undershoot < 10 % of VCC
- IOFF circuitry provides partial Power-down mode operation
- Complies with JEDEC standards:
- JESD8-12 (0.8 V to 1.3 V)
- JESD8-11 (0.9 V to 1.65 V)
- JESD8-7 (1.2 V to 1.95 V)
- JESD8-5 (1.8 V to 2.7 V)
- JESD8C (2.7 V to 3.6 V)
- ESD protection:
- MIL-STD-883, method 3015 Class 3A. Exceeds 5 kV
- HBM JESD22-A114F Class 3A. Exceeds 5 kV
- MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω)
