NETZSCH-Gerätebau GmbH Thermal Diffusivity Measurements - Made Easy - Xenon Flash Apparatus: LFA 447 NanoFlash®

Description
LFA 447 NanoFlash® - Xenon Flash Apparatus Determination of thermophysical properties is quick, easy and cost-effective with the new LFA 447 NanoFlash® Light Flash System. A high-performance Xenon flash lamp takes the place of the laser, which is usually employed for this proven technique. With the integrated sample changer for 4 samples, it is possible to run measurements on several samples automatically. The easily-accessible sample carrier allows short setting periods for test preparation and a high through-put of samples. Unique is the optional scanning device (MTX) for flat samples up to 50 mm x 50 mm for determining differences in the thermal diffusivity over the entire sample surface with a spatial resolution of 100 µm in the x and y directions.

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Thermal Diffusivity Measurements - Made Easy - Xenon Flash Apparatus: LFA 447 NanoFlash® -  - NETZSCH-Gerätebau GmbH
Selb, Germany
Thermal Diffusivity Measurements - Made Easy - Xenon Flash Apparatus: LFA 447 NanoFlash®
Thermal Diffusivity Measurements - Made Easy - Xenon Flash Apparatus: LFA 447 NanoFlash®
LFA 447 NanoFlash® - Xenon Flash Apparatus Determination of thermophysical properties is quick, easy and cost-effective with the new LFA 447 NanoFlash® Light Flash System. A high-performance Xenon flash lamp takes the place of the laser, which is usually employed for this proven technique. With the integrated sample changer for 4 samples, it is possible to run measurements on several samples automatically. The easily-accessible sample carrier allows short setting periods for test preparation and a high through-put of samples. Unique is the optional scanning device (MTX) for flat samples up to 50 mm x 50 mm for determining differences in the thermal diffusivity over the entire sample surface with a spatial resolution of 100 µm in the x and y directions.

LFA 447 NanoFlash® - Xenon Flash Apparatus

Determination of thermophysical properties is quick, easy and cost-effective with the new LFA 447 NanoFlash® Light Flash System.
A high-performance Xenon flash lamp takes the place of the laser, which is usually employed for this proven technique.
With the integrated sample changer for 4 samples, it is possible to run measurements on several samples automatically. The easily-accessible sample carrier allows short setting periods for test preparation and a high through-put of samples.
Unique is the optional scanning device (MTX) for flat samples up to 50 mm x 50 mm for determining differences in the thermal diffusivity over the entire sample surface with a spatial resolution of 100 µm in the x and y directions.

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Technical Specifications

  NETZSCH-Gerätebau GmbH
Product Category Calorimeters and Thermal Analyzers
Product Name Thermal Diffusivity Measurements - Made Easy - Xenon Flash Apparatus: LFA 447 NanoFlash®
Thermal Analyzer Type Thermal Diffusivity
Properties Measured Thermophysical Properties
Certifications ASTM E1461, DIN EN 821
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