Gelest, Inc. HAFNIUM DIMETHYLAMIDE OMHF080

Description
Additional Properties Hydrolytic Sensitivity 8: reacts rapidly with moisture, water, protic solvents Safety Packaging Under Nitrogen ALD Material Atomic layer deposition (ALD) is a chemically self-limiting deposition technique that is based on the sequential use of a gaseous chemical process. A thin film (as fine as -0.1 Å per cycle) results from repeating the deposition sequence as many times as needed to reach a certain thickness. The major characteristic of the films is the resulting conformality and the controlled deposition manner. Precursor selection is key in ALD processes, namely finding molecules which will have enough reactivity to produce the desired films yet are stable enough to be handled and safely delivered to the reaction chamber. Hafnium dimethylamide; Tetrakis(dimethylami do)hafnium Pale yellow solid
Datasheet
Description
Additional Properties Hydrolytic Sensitivity 8: reacts rapidly with moisture, water, protic solvents Safety Packaging Under Nitrogen ALD Material Atomic layer deposition (ALD) is a chemically self-limiting deposition technique that is based on the sequential use of a gaseous chemical process. A thin film (as fine as -0.1 Å per cycle) results from repeating the deposition sequence as many times as needed to reach a certain thickness. The major characteristic of the films is the resulting conformality and the controlled deposition manner. Precursor selection is key in ALD processes, namely finding molecules which will have enough reactivity to produce the desired films yet are stable enough to be handled and safely delivered to the reaction chamber. Hafnium dimethylamide; Tetrakis(dimethylami do)hafnium Pale yellow solid
Datasheet

Suppliers

Company
Product
Description
Supplier Links
HAFNIUM DIMETHYLAMIDE - OMHF080 - Gelest, Inc.
Morrisville, PA, United States
HAFNIUM DIMETHYLAMIDE
OMHF080
HAFNIUM DIMETHYLAMIDE OMHF080
Additional Properties Hydrolytic Sensitivity 8: reacts rapidly with moisture, water, protic solvents Safety Packaging Under Nitrogen ALD Material Atomic layer deposition (ALD) is a chemically self-limiting deposition technique that is based on the sequential use of a gaseous chemical process. A thin film (as fine as -0.1 Å per cycle) results from repeating the deposition sequence as many times as needed to reach a certain thickness. The major characteristic of the films is the resulting conformality and the controlled deposition manner. Precursor selection is key in ALD processes, namely finding molecules which will have enough reactivity to produce the desired films yet are stable enough to be handled and safely delivered to the reaction chamber. Hafnium dimethylamide; Tetrakis(dimethylami do)hafnium Pale yellow solid

Additional Properties


  • Hydrolytic Sensitivity 8: reacts rapidly with moisture, water, protic solvents
    Safety
  • Packaging Under Nitrogen
    ALD Material
    Atomic layer deposition (ALD) is a chemically self-limiting deposition technique that is based on the sequential use of a gaseous chemical process. A thin film (as fine as -0.1 Å per cycle) results from repeating the deposition sequence as many times as needed to reach a certain thickness. The major characteristic of the films is the resulting conformality and the controlled deposition manner. Precursor selection is key in ALD processes, namely finding molecules which will have enough reactivity to produce the desired films yet are stable enough to be handled and safely delivered to the reaction chamber.
    Hafnium dimethylamide; Tetrakis(dimethylamido)hafnium
  • Pale yellow solid
Supplier's Site Datasheet

Technical Specifications

  Gelest, Inc.
Product Category Organic Chemicals
Product Number OMHF080
Product Name HAFNIUM DIMETHYLAMIDE
Chemical Formula C 8 H 2 4 HfN 4
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