Nikon Metrology Eclipse LV150NL Industrial Microscope

Description
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max. sample size: 150 x 150 mm Key benefits Modularized microscope body applicable with various observations and tasks Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body Easy digital imaging ECLIPSE LV150NL with LED illumination
Datasheet

Suppliers

Company
Product
Description
Supplier Links
Eclipse LV150NL Industrial Microscope -  - Nikon Metrology
Leuven, Belgium
Eclipse LV150NL Industrial Microscope
Eclipse LV150NL Industrial Microscope
A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max. sample size: 150 x 150 mm Key benefits Modularized microscope body applicable with various observations and tasks Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body Easy digital imaging ECLIPSE LV150NL with LED illumination

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm

Key benefits

  • Modularized microscope body applicable with various observations and tasks
  • Newly developed CFI60-2 series provides the ultimate in long working distance levels and the most advanced chromatic aberration in a light weight body
  • Easy digital imaging
  • ECLIPSE LV150NL with LED illumination
Supplier's Site Datasheet

Technical Specifications

  Nikon Metrology
Product Category Microscopes
Product Name Eclipse LV150NL Industrial Microscope
Application Observation, Inspection, Research
Grade Benchtop
Objective Lenses 4
Eyepiece Style Trinocular
Unlock Full Specs
to access all available technical data

Similar Products

Tungsten Filament Scanning Electron Microscope - SEM3200 - CIQTEK Co., Ltd
Specs
Application Metallurgical; Semiconductor
Grade Benchtop; Research
Microscope Type Scanning Electron Microscope
View Details
Inverted Optical Microscope - RM21™ - Mad City Labs, Inc.
Specs
Application Biological / Life Sciences
Grade Research
Microscope Type Fluorescent; Inverted; Scanning Probe / Atomic Force
View Details
UV Inspection Microscope - PCE-MM 200UV - PCE Instruments / PCE Americas Inc.
PCE Instruments / PCE Americas Inc.
Specs
Grade Handheld
Microscope Type Fluorescent
Features Digital Display; Fine Focus
View Details
3D Optical Surface Profiler, ZeGage™ -  - Zygo Corporation
Specs
Application Measuring / Toolmaker / Inspection
Grade Benchtop
Features Digital Display
View Details