A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.
Max. sample size: 150 x 150 mm.
Microscope type
Modularized microscope body applicable with various observations and tasks
Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations.
It supports diverse and advanced research, analysis and inspection.
| Nikon Metrology | |
|---|---|
| Product Category | Microscopes |
| Product Name | Eclipse LV150N Industrial Microscope |
| Application | Semiconductor |
| Grade | Benchtop |
| Objective Lenses | 4 |
| Eyepiece Style | Trinocular |
