Nikon Metrology Eclipse LV150N Industrial Microscope

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging. Max. sample size: 150 x 150 mm. Microscope type Dedicated reflected illumination models Manual type Modularized microscope body applicable with various observations and tasks Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations. It supports diverse and advanced research, analysis and inspection.