Nikon Metrology Eclipse L300N Series FPD/LSI Inspection Microscope

Description
Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays. Epi-fluorescence Observation The L300N/L300ND features powerful epi-fluorescence observation capabilities, widening the inspection range-- including 365 nm excitation. Diascopic illumination and various observation methods such as brightfield, darkfield, simple polarizing, and DIC are also possible. This observation versatility is highly beneficial in inspection of semiconductor resist residues and organic electroluminescence displays. Motorized Mercury Fiber Illuminator The Nikon Intensilight motorized mercury precentered fiber illuminator provides superior epi-fluorescence observation. Lamp centering and focus adjustment are not necessary, even after lamp replacement. The light source can be placed away from the microscope, reducing heat near the microscope and preventing defocusing. Variable light intensity and shutter control provide excellent flexibility. The lamp has an average lifespan of 2000 hours.
Datasheet

Suppliers

Company
Product
Description
Supplier Links
Eclipse L300N Series FPD/LSI Inspection Microscope -  - Nikon Metrology
Leuven, Belgium
Eclipse L300N Series FPD/LSI Inspection Microscope
Eclipse L300N Series FPD/LSI Inspection Microscope
Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays. Epi-fluorescence Observation The L300N/L300ND features powerful epi-fluorescence observation capabilities, widening the inspection range-- including 365 nm excitation. Diascopic illumination and various observation methods such as brightfield, darkfield, simple polarizing, and DIC are also possible. This observation versatility is highly beneficial in inspection of semiconductor resist residues and organic electroluminescence displays. Motorized Mercury Fiber Illuminator The Nikon Intensilight motorized mercury precentered fiber illuminator provides superior epi-fluorescence observation. Lamp centering and focus adjustment are not necessary, even after lamp replacement. The light source can be placed away from the microscope, reducing heat near the microscope and preventing defocusing. Variable light intensity and shutter control provide excellent flexibility. The lamp has an average lifespan of 2000 hours.

Nikon Eclipse L300N/L300ND FPD / Wafer Inspection microscopes incorporate Nikon’s renowned CFI60 infinity optics, offering the world’s highest level of optical performance. The enhanced epi-fluorescence function, which enables 365nm UV excitation, is optimal for the inspection of semiconductor resist residues on 300mm wafers and organic electroluminescence displays.

Epi-fluorescence Observation

The L300N/L300ND features powerful epi-fluorescence observation capabilities, widening the inspection range-- including 365 nm excitation. Diascopic illumination and various observation methods such as brightfield, darkfield, simple polarizing, and DIC are also possible. This observation versatility is highly beneficial in inspection of semiconductor resist residues and organic electroluminescence displays.

Motorized Mercury Fiber Illuminator

  • The Nikon Intensilight motorized mercury precentered fiber illuminator provides superior epi-fluorescence observation.
  • Lamp centering and focus adjustment are not necessary, even after lamp replacement.
  • The light source can be placed away from the microscope, reducing heat near the microscope and preventing defocusing.
  • Variable light intensity and shutter control provide excellent flexibility.
  • The lamp has an average lifespan of 2000 hours.
Supplier's Site Datasheet

Technical Specifications

  Nikon Metrology
Product Category Microscopes
Product Name Eclipse L300N Series FPD/LSI Inspection Microscope
Application Semiconductor
Grade Benchtop
Objective Lenses 4
Eyepiece Style Trinocular
Unlock Full Specs
to access all available technical data

Similar Products

Tungsten Filament Scanning Electron Microscope - SEM3200 - CIQTEK Co., Ltd
Specs
Application Metallurgical; Semiconductor
Grade Benchtop; Research
Microscope Type Scanning Electron Microscope
View Details
High Resolution, Atomic Force Microscope - SPM-M Kit - Mad City Labs, Inc.
Specs
Application Biological / Life Sciences
Microscope Type Scanning Probe / Atomic Force
View Details
Digital Inspection Microscope - PCE-MM 800 - PCE Instruments / PCE Americas Inc.
PCE Instruments / PCE Americas Inc.
Specs
Grade Handheld
Features Digital Display
Remote Interface Computer Interface; Serial Interface; Application Software Included.
View Details
3D Optical Surface Profiler, ZeGage™ -  - Zygo Corporation
Specs
Application Measuring / Toolmaker / Inspection
Grade Benchtop
Features Digital Display
View Details