Micron Technology, Inc. Memory PC28F00AP33EF0

The PC28F00AP33EF0 is a 1Gb Parallel NOR Flash memory device from Quarktwin Technology Ltd., designed for high performance and reliability. It features a 64-ball Easy BGA package and operates at a core voltage of 2.3V to 3.6V. The device supports a maximum clock frequency of 52 MHz with zero WAIT states, allowing for efficient synchronous burst read operations. It offers a typical initial access time of 100 ns and supports various burst modes. The memory architecture includes multiple blocks, with a minimum of 100,000 erase cycles per block, ensuring durability for applications requiring frequent data updates. The device also incorporates security features such as one-time programmable registers and individual block locking capabilities. Typical standby current is 75 µA, making it suitable for low-power applications. The operating temperature range is from -40°C to +85°C, which enhances its applicability in diverse environments. Engineers considering this memory device will find it suitable for applications requiring high-speed data access and robust performance in embedded systems.