Microchip Technology, Inc. Silicon Carbide Test/Evaluation Products MSCDR-EFUSE-004

Description
The E-Fuse demonstrator can detect and interrupt fault currents in microseconds, 100–500 times faster than traditional mechanical approaches because of its high-voltage solid-state design. The fast response time substantially reduces peak short-circuit currents from tens of kilo-amps to hundreds of amps, which can prevent a fault event from resulting in a hard failure. Enabled by silicon carbide technology, the demonstrator board is available in six variants for 400-800V battery systems and with current ratings up to 30 amps.
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Description
The E-Fuse demonstrator can detect and interrupt fault currents in microseconds, 100–500 times faster than traditional mechanical approaches because of its high-voltage solid-state design. The fast response time substantially reduces peak short-circuit currents from tens of kilo-amps to hundreds of amps, which can prevent a fault event from resulting in a hard failure. Enabled by silicon carbide technology, the demonstrator board is available in six variants for 400-800V battery systems and with current ratings up to 30 amps.
Request a Quote Datasheet

Suppliers

Company
Product
Description
Supplier Links
Silicon Carbide Test/Evaluation Products - MSCDR-EFUSE-004 - Richardson RFPD
Downers Grove, IL, United States
Silicon Carbide Test/Evaluation Products
MSCDR-EFUSE-004
Silicon Carbide Test/Evaluation Products MSCDR-EFUSE-004
The E-Fuse demonstrator can detect and interrupt fault currents in microseconds, 100–500 times faster than traditional mechanical approaches because of its high-voltage solid-state design. The fast response time substantially reduces peak short-circuit currents from tens of kilo-amps to hundreds of amps, which can prevent a fault event from resulting in a hard failure. Enabled by silicon carbide technology, the demonstrator board is available in six variants for 400-800V battery systems and with current ratings up to 30 amps.

The E-Fuse demonstrator can detect and interrupt fault currents in microseconds, 100–500 times faster than traditional mechanical approaches because of its high-voltage solid-state design. The fast response time substantially reduces peak short-circuit currents from tens of kilo-amps to hundreds of amps, which can prevent a fault event from resulting in a hard failure.

Enabled by silicon carbide technology, the demonstrator board is available in six variants for 400-800V battery systems and with current ratings up to 30 amps.

Supplier's Site Datasheet
Evaluation and Demonstration Boards and Kits - 150-MSCDR-EFUSE-004-ND - DigiKey
Thief River Falls, MN, United States
Evaluation and Demonstration Boards and Kits
150-MSCDR-EFUSE-004-ND
Evaluation and Demonstration Boards and Kits 150-MSCDR-EFUSE-004-ND
800V10A SIC E-FUSE DEMONSTRATOR

800V10A SIC E-FUSE DEMONSTRATOR

Buy Now Datasheet
Development Boards, Kits, Programmers - Evaluation Boards - Evaluation and Demonstration Boards and Kits - MSCDR-EFUSE-004 - Acme Chip Technology Co., Limited
Shenzhen, China
Development Boards, Kits, Programmers - Evaluation Boards - Evaluation and Demonstration Boards and Kits
MSCDR-EFUSE-004
Development Boards, Kits, Programmers - Evaluation Boards - Evaluation and Demonstration Boards and Kits MSCDR-EFUSE-004
800V10A SIC E-FUSE DEMONSTRATOR

800V10A SIC E-FUSE DEMONSTRATOR

Supplier's Site

Technical Specifications

  Richardson RFPD DigiKey Acme Chip Technology Co., Limited
Product Category Electronic Development Boards Electronic Development Boards Electronic Development Boards
Product Number MSCDR-EFUSE-004 150-MSCDR-EFUSE-004-ND MSCDR-EFUSE-004
Product Name Silicon Carbide Test/Evaluation Products Evaluation and Demonstration Boards and Kits Development Boards, Kits, Programmers - Evaluation Boards - Evaluation and Demonstration Boards and Kits
Category Developement Board Developement Board Developement Board
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